Measuring and analyzing the impact of implementing sub-process monitoring and defect prediction model in the software development life cycle / Vipul Vashisht
Material type:
TextPublication details: New Delhi : IGNOU, 2016.Description: xxiii, 218 pages : col. ill. ; 29 cmSubject(s): DDC classification: - 23 005.14 V442M
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Thesis | Library and Documentation Division PGRRL | 005.14 V442M (Browse shelf(Opens below)) | Available | TH000574 |
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