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Measuring and analyzing the impact of implementing sub-process monitoring and defect prediction model in the software development life cycle / Vipul Vashisht

By: Material type: TextTextPublication details: New Delhi : IGNOU, 2016.Description: xxiii, 218 pages : col. ill. ; 29 cmSubject(s): DDC classification:
  • 23 005.14 V442M
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Item type Current library Call number Status Date due Barcode
Thesis Library and Documentation Division PGRRL 005.14 V442M (Browse shelf(Opens below)) Available TH000574

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