Prof. G Ram Reddy Library
Image from Google Jackets

Electronic component reliability fundamentals, modelling, evaluation, and assu Finn JENSEN

By: Material type: TextTextSeries: Wiley series in quality and reliability engineeringPublication details: Chichester John Wiley 1995Description: xvii,355pISBN:
  • 471952966
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
Books Library and Documentation Division 620.00452 J453E (Browse shelf(Opens below)) Available 035836

There are no comments on this title.

to post a comment.

© Prof. G Ram Reddy Centre Library, Indira Gandhi National Open University, Maidan Garhi, New Delhi, 110068
+91-011-29532797 | FAX+91-011-29533393 |