Relibility wearout mechanisms in advanced CMOS technologies A.W. Strong
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TextPublication details: New Jersey John Wiley 2009Description: xv; 624pISBN: - 9780471731726
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | Library and Documentation Division | 621.39732 R279 (Browse shelf(Opens below)) | Available | 076313 |
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| 621.395 Y321P Practical low power digital VLSI design | 621.396 P262I Industrial electric furnaces and appliances | 621.397 M519 Memory and storage | 621.39732 R279 Relibility wearout mechanisms in advanced CMOS technologies | 621.39732 T348 Thin film ferroelectric materials and devices | 621.3976 As35M Magnetic disk drive technology | 621.3976 D851F Fundamentals of electrical drives |
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