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Atomic force microscopy/scanning tunneling microscopy 2 Samuel H. Cohen

By:

Cohen, Samuel H

Material type: Text

Text

TextPublication details: New York Plenum Press 1997Description: ix,250pISBN:

030645596x

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Library and Documentation Division	502.82 At71 (Browse shelf(Opens below))	Available		049663

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