000 00570nam a2200193Ia 4500
003 LDD
008 181029s9999 xx 000 0 und d
020 _a030645596x
_cUS
_162.00
040 _cLDD
100 _aCohen, Samuel H.
245 0 _aAtomic force microscopy/scanning tunneling microscopy 2
_cSamuel H. Cohen
260 _aNew York
_bPlenum Press
_c1997
300 _aix,250p.
365 _bUS
_162.00
901 _a2170
_b03-03-2001
902 _a621
_b07-03-2001
_cF
_dUS
_e58
903 _aDiscount-10
_bReqst by : Swadesh Taneja
942 _2ddc
_cBK
999 _c66338
_d66338